ADVANCED SURFACE PROCESSES, LLC

Capabilities

Scanning electron microscope (SEM) imaging capable of resolving and measuring features down to 3nm in high vacuum, 4nm in low vacuum. We can accommodate samples up to 2 inches cubed, both conductive and non-conductive, and up to 2lb in weight. Images can be obtained from multiple viewing angles, including normal to the surface and off-axis to capture detailed surface topography. Energy dispersive x-ray spectroscopy (EDS) identifies the elemental makeup of the features in the microscope's field of view. The silicon drift detector EDS system provides spectra and area maps showing elemental identification, composition, distribution, and line profiles. Our sample preparation services include sample size reduction, diamond wire saw cross-sectioning, ion beam cross-section polishing, and gold sputter coating on non-conducting samples to improve image contrast and quality. Specialized mounting requirements can be met in-house.