Light Conversion Carbide/Orpheus, NIR Laser

Precise measurements of thermal properties at the nanoscale are needed for engineering of advanced and heterogeneously integrated devices but are currently unattainable. We will radically advance thermal metrology by developing new tools for mapping thermal conductivity (¿) and interfacial thermal conductance (G) at the nanoscale, with high precision (¿¿<5%, ¿G<10%) and throughput (˜25·106improvement). This will be achieved by wide bandwidth detection of the transient photothermal expansion of a sample using either NIST-made optomechanical AFM probes (˜10¿nm resolution, 20 ms/pixel) or a far-field, super-resolution microscope (˜500 nm resolution, ˜5 µs/pixel, ˜100 µm depth sensitivity).

Estimated value

$1M - $1.9M

Contract type

Unknown

• NAICS334413
• PSC334413