FEI Electrochemical Cells for TEM/X-ray Scattering

The semiconductor supply chain is global, specialized, and interconnected. Chipmakers do business with thousands of individual suppliers that provide the highly complex materials and tools used to produce semiconductors. To address the lack of full visibility into the semiconductor supply chain and R&D ecosystem gaps, NIST conducts measurement science, or metrology, critical to developing new materials, packaging, and production methods in chip manufacturing. Division 642, Materials Science and Engineering Division (MSED) at the National Institute of Standards and Technology (NIST) is an organization whose mission includes developing techniques for structure and property measurements in CHIPS-relevant materials at the nanoscale under working conditions. This project requires an in-situ electrochemical cell with heating and cooling for use in both transmission electron microscopes (TEM) and X-ray scattering beamline instruments.

Estimated value

$250K - $499K

Contract type

Unknown

• NAICS334413
• PSC334413