Micro x-ray source for defect detection in metallic AM structures

NASA/NSSC has a requirement for Micro x-ray source for defect detection in metallic AM structures. See the attached SOW and request for capability statements. All correspondence must reference the notice ID in the subject line for reference. NOTE: Quotes received in response to this notice will NOT be considered and will not be evaluated by NASA’s Technical End User Team. We are currently only requesting Capability Statements.

• NAICS334516
• PSC6640

• Tab 07 Capability Statement.pdf

  .pdf195 KBNot yet available
• Tab 04 SOW.pdf

  .pdf103 KBNot yet available

• Lindsey McLellan
  lindsey.m.mclellan@nasa.gov
• Bobbie Young
  bobbie.j.young@nasa.gov