Resistivity Measurement System Suite, 4-Point Probe

The objective of this acquisition is to provide the Department with a comprehensive, multi-environment resistivity measurement capability. This suite will support mission-critical analysis of semiconductor materials, thin films, and conductive polymers across a full range of physical and thermal conditions. Please see attached Statement of Work (SOW) for more specific technical information.

• NAICS334516
• PSC6640

• Performance Work Statement.pdf

  .pdf253 KBNot yet available

• Shaun Bunnell
  shaun.bunnell@dla.mil6146932603
• Jacob Combs
  jacob.combs@dla.mil445737398