CHIPS R&D Custom Diffractometry and Fourier Ptychography Endstation

See attachments for solicitation details.

• NAICS334519
• PSC6640

• Statement of Work.docx

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• Attachment 2- Applicable Provisions and Clauses.docx

  .docx53 KB
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• Solicitation_1333ND26QNB680229.docx

  .docx47 KB
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• Donald Collie
  donald.collie@nist.gov
• Tracy Retterer
  tracy.retterer@nist.gov